ABSTRACT
In two previous chapters, the analysis and simulation of some microstrip test circuits were performed. Here, in order to validate the theoretical procedures, the results of its physical characterization using a commercial network analyzer are presented. The first measurement was done over a simple 25-Ω microstrip transmission line. The line was constructed using a substrate of polythetrafluoroetilene (Teflon) with a dielectric constant of 10.5 (DUROID® 6010, ε r = 10.5). As previously mentioned, the synthesis was carried out with the method of moments (MoM), using the program presented in Chapter 2. The obtained dimensions were H = 0.1882 cm and L = 3.7 cm.
