This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.

chapter 1|17 pages

Introduction to Atomic Force Microscopy

chapter 2|17 pages

Tip-Sample Forces

chapter 3|13 pages

AFM Electronics

chapter 4|10 pages

AFM Cantilevers and Probes

chapter 5|12 pages

Contact Mode AFM

chapter 6|14 pages

Lateral Force Microscopy

chapter 7|16 pages

Conductive Atomic Force Microscopy

chapter 8|23 pages

Oscillating Modes of AFM

chapter 9|10 pages

Image Processing