ABSTRACT
"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
X-ray physics; wavelength-dispersive X-ray fluorescence; energy-dispersive x-ray flourescences; data analysis; quantification in XRF analysis of infinitely thick samples; quantification in XRF analysis of intermediate-thickness samples; radioisotope X-ray analysis; synchrotron radiation X-ray emission; total-reflection XRF; polarized beam XRF; capillary beam XRF or X-ray micro-flourescence; particle-induced X-ray emission; electron-induced X-ray emission; sample preparation for XRF.
